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Hardness of k-LWE and Applications in Traitor Tracing
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BibTeX
@article{eprint-2014-25636, title={Hardness of k-LWE and Applications in Traitor Tracing}, journal={IACR Cryptology ePrint Archive}, volume={2014}, pages={494}, url={https://eprint.iacr.org/2014/494}, author={San Ling and Duong Hieu Phan and Damien Stehlé and Ron Steinfeld}, year=2014 }